Why do GaN and SiC devices need unique test equipment? Power semiconductors employing silicon carbide (SiC) and gallium nitride (GaN) have higher power density, smaller size, better high temperature ...
Testing is at the heart of the R&D process, which makes the test facilities used to develop and validate new products a vital component when producing innovative, effective, and safe products.
Recently, Trina Storage has successfully completed a full-container 5MWh Large-Scale Fire Test (LSFT) of its self-developed Elementa 2 Pro system under extreme conditions, achieving zero thermal ...