Designing for yield is an afterthought in today's design flows, whether it is digital, analog/RF or mixed-signal. The lack of design for yield tools has forced the digital world to accept overly ...

As the need to scale transistors to ever-smaller sizes continues to press on technology designers, the impact of parasitic resistance and capacitance can approach or even outpace other aspects of ...

Virtual fabrication is used to evaluate the performance of interconnects (line and via resistance, capacitance, etc.) across pitches compatible with either EUV single exposure or SADP for three ...

San Mateo, Calif. – Process integration engineers are gradually losing their battle to keep process variations hidden behind the defensive barrier of tight design rules. Variations in metal line ...

This subcommittee will utilize symbols and identification per ANSI/ISA-5.1-2009, Instrumentation Symbols and Identification, in combination with other ISA standards, commonly used equipment symbols, ...