At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Please provide your email address to receive an email when new articles are posted on . Researchers found that VRVF results were in reasonable agreement with baseline SAP. VRVF exams had higher ...

Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...

In the world of embedded software development, defects can cripple projects, delay releases, and ultimately lead to failures that affect everything from consumer electronics to mission-critical ...

This illustration depicts a non-destructive evaluation system empowered by generative artificial intelligence (AI) to simulate and analyze internal material defects. Leveraging virtual defect ...

While technology can change quickly, getting your people to change takes a great deal longer. That’s why the people- intensive job of developing software has had essentially the same problems for over ...

If the technique is confirmed, women who have had miscarriages or those undergoing prenatal screening may no longer need to rely on centralized testing labs for results. By Gina Kolata After 10 years ...